The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 22, 2021
Filed:
Dec. 17, 2018
Mitutoyo Corporation, Kanagawa, JP;
Tetsuya Koga, Miyazaki, JP;
MITUTOYO CORPORATION, Kanagawa, JP;
Abstract
Utilizing a load generated by a non-linear spring, a spring constant of which increases as an amount of deformation increases, a measuring apparatus presses an indenter against a material surface and evaluates material characteristics. The measuring apparatus includes: an actuator that causes the non-linear spring to deform; a scale that measures the amount of deformation of the non-linear spring when the non-linear spring is deformed; and a controller that stores non-linear spring characteristic data for reciprocally calculating the amount of deformation and the load, and that drives the actuator based on the amount of deformation and the non-linear spring characteristic data such that the load reaches a target load.