The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 15, 2021

Filed:

Jun. 09, 2020
Applicant:

Kandou Labs SA, Lausanne, CH;

Inventors:

Kiarash Gharibdoust, Lonay, CH;

Armin Tajalli, Salt Lake City, UT (US);

Pavan Kumar Jampani, Northampton, GB;

Ali Hormati, Ecublens Vaud, CH;

Assignee:

KANDOU LABS, S.A., Lausanne, CH;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 1/12 (2006.01); H03M 1/36 (2006.01); H03M 1/10 (2006.01); H03M 1/06 (2006.01);
U.S. Cl.
CPC ...
H03M 1/1245 (2013.01); H03M 1/069 (2013.01); H03M 1/1004 (2013.01); H03M 1/1215 (2013.01); H03M 1/365 (2013.01);
Abstract

Methods and systems are described for generating a process-voltage-temperature (PVT)-dependent reference voltage at a reference branch circuit based on a reference current obtained via a band gap generator and a common mode voltage input, generating a PVT-dependent output voltage at an output of a static analog calibration circuit responsive to the common mode voltage input and an adjustable current, adjusting the adjustable current through the static analog calibration circuit according to a control signal generated responsive to comparisons of the PVT-dependent output voltage to the PVT-dependent reference voltage, and configuring a clocked data sampler with a PVT-calibrated current by providing the control signal to the clocked data sampler.


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