The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 15, 2021

Filed:

Apr. 13, 2018
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Peter Mayer, Neubiberg, DE;

Martin Brox, Munich, DE;

Wolfgang Anton Spirkl, Germering, DE;

Marcos Alvarez Gonzalez, Munich, DE;

Casto Salobrena Garcia, Munich, DE;

Andreas Schneider, Maisach, DE;

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 12/00 (2006.01); G06F 3/06 (2006.01); G06F 1/04 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0632 (2013.01); G06F 1/04 (2013.01); G06F 3/0613 (2013.01); G06F 3/0673 (2013.01);
Abstract

A method includes varying a number of clock characteristics of each a plurality of memory devices of a memory concurrently, determining a fitness of the memory for each variation of the number of clock characteristics, selecting a particular variation of the number of clock characteristics based on the determined fitness of the memory for the particular variation, changing a setting in each of the plurality of memory devices corresponding to the particular variation to generate an additional variation of the number of clock characteristics, and determining a fitness of the memory for the additional variation.


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