The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 08, 2021

Filed:

Sep. 18, 2019
Applicant:

Taiwan Semiconductor Manufacturing Co., Ltd., Hsin-Chu, TW;

Inventors:

Meng-Han Lin, Hsinchu, TW;

Chih-Ren Hsieh, Changhua, TW;

Wei Cheng Wu, Zhubei, TW;

Chih-Pin Huang, Hsinchu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/11548 (2017.01); H01L 29/423 (2006.01); H01L 29/66 (2006.01); H01L 23/532 (2006.01); H01L 27/11524 (2017.01); H01L 21/768 (2006.01); H01L 21/033 (2006.01); H01L 21/762 (2006.01); H01L 21/321 (2006.01);
U.S. Cl.
CPC ...
H01L 27/11548 (2013.01); H01L 21/0337 (2013.01); H01L 21/3212 (2013.01); H01L 21/762 (2013.01); H01L 21/76832 (2013.01); H01L 23/5329 (2013.01); H01L 27/11524 (2013.01); H01L 29/42328 (2013.01); H01L 29/66545 (2013.01); H01L 29/66553 (2013.01);
Abstract

Various embodiments of the present application are directed to an embedded memory boundary structure with a boundary sidewall spacer, and associated forming methods. In some embodiments, an isolation structure is disposed in a semiconductor substrate to separate a memory region from a logic region. A memory cell structure is disposed on the memory region and a cell boundary structure is formed on the isolation structure including a boundary sidewall spacer. A protecting dielectric layer is disposed on a top surface of the boundary sidewall spacer. The boundary sidewall spacer and the protecting dielectric layer provide a smooth boundary sidewall that is not subject to damage during formation of the logic device structure and, hence, is not subject to trapping high κ etch residue during formation of the logic device structure with HKMG technology.


Find Patent Forward Citations

Loading…