The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 08, 2021

Filed:

Jul. 05, 2019
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Fan Li, Shanghai, CN;

Guo Qiang Hu, Beijing, CN;

Sheng Nan Zhu, Shanghai, CN;

Jun Zhu, Shanghai, CN;

Jing Chang Huang, Shanghai, CN;

Peng Ji, Shanghai, CN;

Yuan Yuan Ding, Shanghai, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06K 9/62 (2006.01); G06T 5/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/001 (2013.01); G06K 9/6267 (2013.01); G06T 5/005 (2013.01); G06T 2207/10048 (2013.01); G06T 2207/30108 (2013.01);
Abstract

A method, a device and a computer program product for image processing are proposed. In the method, whether a first image indicates a defect associated with a target object is determined. In response to determining that the first image indicates the defect, a second image absent from the defect is obtained based on the first image. The defect is identified by comparing the first image with the second image. In this way, the defect associated with the target object in the image can be accurately and efficiently identified or segmented.


Find Patent Forward Citations

Li, Fan. (2021). Image defect identification (U.S. Patent No. 11030738). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11030738

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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