The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 08, 2021
Filed:
Dec. 08, 2016
Integrated-x, Inc., San Diego, CA (US);
Henry Fung, San Diego, CA (US);
Bruk Sahilu, San Diego, CA (US);
Valentin Macavei, Signal Hill, CA (US);
Huy Ly, Santee, CA (US);
Integrated-X, Inc., San Diego, CA (US);
Abstract
This disclosure provides a system and method for inspecting a component. The device can have a detector positioning system coupled to a detector and operable to move the detector within five degrees of freedom. The device can have an emitter positioning system operably coupled to the emitter and operable to move the emitter in three dimensions. The device can move the detector to a reference point above the component, the reference point being separated by a radius (ρ) on the applicate axis from an inspection point on the component. The controller can also receive at least one input from a display, and command the detector to a detector position within a spherical dome centered on the reference point based on the at least one input.