The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 01, 2021

Filed:

Jan. 07, 2020
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Hsueh-Chung Chen, Cohoes, NY (US);

Lawrence A. Clevenger, Saratoga Springs, NY (US);

Daniel James Dechene, Watervliet, NY (US);

Somnath Ghosh, Clifton Park, NY (US);

Carl Radens, LaGrangeville, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/768 (2006.01); H01L 21/8238 (2006.01); H01L 21/02 (2006.01); H01L 21/306 (2006.01); H01L 23/528 (2006.01); H01L 23/522 (2006.01); H01L 23/532 (2006.01);
U.S. Cl.
CPC ...
H01L 21/823871 (2013.01); H01L 21/02532 (2013.01); H01L 21/30604 (2013.01); H01L 21/76877 (2013.01); H01L 23/528 (2013.01); H01L 23/5223 (2013.01); H01L 23/5228 (2013.01); H01L 23/53228 (2013.01);
Abstract

A method is presented for forming a multi-level of interconnects underneath a complementary metal oxide semiconductor (CMOS) device. The method includes forming a stack including alternating layers of a semiconductor material and a first conductive material, patterning vias in the stack to define multiple stacks, depositing a first block material within each of the vias, forming a series of first block materials within a first via, forming a series of second block materials within a second via, the first and second vias being on opposed ends of a stack of the multiple stacks, and performing vertical metallization between the first block material and the series of first block materials in the first via, and between the first block material and the series of second block materials in the second via.


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