The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 01, 2021
Filed:
Dec. 19, 2019
Applicant:
Carl Zeiss Microscopy Gmbh, Jena, DE;
Inventors:
Assignee:
CARL ZEISS MICROSCOPY GMBH, Jena, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G02B 21/36 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0002 (2013.01); G02B 21/365 (2013.01); G06T 2207/10056 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/30168 (2013.01);
Abstract
A computer-implemented method for ascertaining a need for predictive maintenance for a microscope system. A microscope system, which an image sensor for recording digital images of a sample, recording digital images during regular operation of the microscope system, and providing a digital image as an input data set to an image analysis system, is provided. At least one feature relating to a malfunction of the microscope system during regular operation is determined, a status signal is produced, and a component group of the microscope system for which a maintenance procedure is necessary is determined.