The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 01, 2021

Filed:

Jun. 23, 2015
Applicant:

Freescale Semiconductor, Inc., Austin, TX (US);

Inventors:

Robert Cristian Krutsch, Munich, DE;

Oliver Bibel, Grasbrunn, DE;

Rolf Dieter Schlagenhaft, Poing, DE;

Dirk Wendel, Grasbrunn, DE;

Assignee:

NXP USA, Inc., Austin, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 1/20 (2006.01); G06T 15/04 (2011.01); G06T 15/00 (2011.01); G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
G06T 1/20 (2013.01); G06F 11/00 (2013.01); G06T 15/005 (2013.01); G06T 15/04 (2013.01);
Abstract

The present application relates to an apparatus for verifying fragment processing related data and a method of operating thereof. The fragment shader unit is coupled to the at least one data buffer. A fragment shader unit of a graphics processing pipeline receives fragment data and records fragment processing related data in the at least one data buffer on processing one or more fragments in accordance with the received fragment data. A comparator unit coupled to the at least one data buffer compares the recorded fragment processing related data in the at least one data buffer to reference data and issues a fault indication signal in case the recorded fragment processing related data and the reference data mismatch.


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