The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 01, 2021
Filed:
Nov. 13, 2017
Siemens Healthcare Diagnostics Inc., Tarrytown, NY (US);
Stefan Kluckner, Berlin, DE;
Shanhui Sun, Princton, NJ (US);
Yao-Jen Chang, Princeton, NJ (US);
Terrence Chen, Princeton, NJ (US);
Benjamin S. Pollack, Jersey City, NJ (US);
Siemens Healthcare Diagnostics Inc., Tarrytown, NY (US);
Abstract
A method of characterizing a specimen for HILN (H, I, and/or L, or N). The method includes capturing images of the specimen at multiple different viewpoints, processing the images to provide segmentation information for each viewpoint, generating a semantic map from the segmentation information, selecting a synthetic viewpoint, identifying front view semantic data and back view semantic data for the synthetic viewpoint, and determining HILN of the serum or plasma portion based on the front view semantic data with an HILN classifier, while taking into account back view semantic data. Testing apparatus and quality check modules adapted to carry out the method are described, as are other aspects.