The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 18, 2021

Filed:

Apr. 13, 2020
Applicant:

Mentor Graphics Corporation, Wilsonville, OR (US);

Inventors:

Yu Huang, West Linn, OR (US);

Janusz Rajski, West Linn, OR (US);

Mark A. Kassab, Wilsonville, OR (US);

Wu-Tung Cheng, Lake Oswego, OR (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/333 (2020.01); G06F 17/18 (2006.01); G06F 119/02 (2020.01);
U.S. Cl.
CPC ...
G06F 30/333 (2020.01); G06F 17/18 (2013.01); G06F 2119/02 (2020.01);
Abstract

One, two, or three test pattern generation and encoding processes are performed for a circuit design to generate compressed test patterns for one or two input channel numbers. The one, two, or three test pattern generation and encoding processes are configured to minimize active input channels for each of the compressed test patterns. A test pattern count for each of a plurality of input channel numbers is determined based on the compressed test patterns for the one or two input channel numbers, a number of active input channels for each of the compressed test patterns, and an assumption of similar input data volumes for different numbers of input channels. The test pattern count information can be employed to determine an optimal number of input channels for a test decompressor.


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