The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 11, 2021

Filed:

Dec. 17, 2019
Applicant:

Sandisk Technologies Llc, Addison, TX (US);

Inventors:

Hua-Ling Cynthia Hsu, Milpitas, CA (US);

YenLung Li, San Jose, CA (US);

Aaron Lee, Mountain View, CA (US);

Assignee:

SanDisk Technologies LLC, Addison, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01); G11C 29/02 (2006.01); G11C 7/10 (2006.01); G11C 11/4094 (2006.01); G11C 11/408 (2006.01);
U.S. Cl.
CPC ...
G11C 29/848 (2013.01); G11C 7/106 (2013.01); G11C 7/1087 (2013.01); G11C 11/4085 (2013.01); G11C 11/4094 (2013.01); G11C 29/022 (2013.01);
Abstract

Apparatuses and techniques are described for reliably storing bad column data in a memory device. Units of bad column data and related units of error detection data are stored in non-adjacent groups of memory cells connected to a word line in a ROM block. A unit of bad column data and a related unit of error detection data can be stored in respective groups of memory cells which are relatively far apart from one another along the word line. This helps ensure that a defect in some NAND strings will not affect both the unit of bad column data and a related unit of error detection data. In another aspect, a unit of bad column data and a related unit of error detection data can be stored using different input/output circuits to further increase robustness.


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