The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 11, 2021

Filed:

Feb. 06, 2019
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventors:

Peter L. Doyle, El Dorado Hills, CA (US);

Devan Burke, Portland, OR (US);

Subramaniam Maiyuran, Gold River, CA (US);

Abhishek R. Appu, El Dorado Hills, CA (US);

Joydeep Ray, Folsom, CA (US);

Elmoustapha Ould-Ahmed-Vall, Chandler, AZ (US);

Philip R. Laws, Santa Clara, CA (US);

Altug Koker, El Dorado Hills, CA (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 15/00 (2011.01); G06T 17/20 (2006.01); G06T 15/80 (2011.01); G06T 15/04 (2011.01); G06T 17/10 (2006.01);
U.S. Cl.
CPC ...
G06T 17/20 (2013.01); G06T 15/005 (2013.01); G06T 15/80 (2013.01); G06T 17/205 (2013.01); G06T 15/04 (2013.01); G06T 17/10 (2013.01);
Abstract

Systems, apparatuses and methods may provide a way to subdivide a patch generated in graphics processing pipeline into sub-patches, and generate sub-patch tessellations for the sub-patches. More particularly, systems, apparatuses and methods may provide a way to diverge tessellation sizes to a configurable size within an interior region of a patch or sub-patches based on a position of each of the tessellations. The systems, apparatuses and methods may determine a number of tessellation factors to use based on one or more of a level of granularity of one or more domains of a scene to be digitally rendered, available computing capacity, or power consumption to compute the number of tessellation factors.


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