Apparatus and method for reducing radiation induced multiple-bit memory soft errors

Abstract

A disclosed apparatus and method reduce the likelihood of multiple bit single event upset (SEU) errors in space-deployed memory devices and memory macros. For each memory, a bit selection layer effectively increases the mux of the memory bit table, thereby reducing the word size while increasing the word capacity, without changing the total memory capacity. As a result, the separation between the physical bit storage locations for each word is increased, thereby reducing the likelihood of multiple bit SEU errors. A buffer can be implemented if the memory lacks individual bit write control. The memory can be implemented in a core integrated circuit (IC) of an multi-chip module (MCM) hybrid integrated circuit (HIC), and the bit selection layer and/or buffer can be implemented in a chiplet or chiplets of the MCM-HIC.