The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 27, 2021
Filed:
Feb. 22, 2018
Rigaku Corporation, Tokyo, JP;
Seiitsu Kurita, Amagasaki, JP;
RIGAKU CORPORATION, Tokyo, JP;
Abstract
Provided is a fluorescent X-ray analysis apparatus, including: a collecting portion configured to drop a liquid droplet onto a substrate having an object to be measured on a surface thereof and move the dropped liquid droplet on the surface of the substrate to collect the object to be measured into the liquid droplet; a drying portion configured to dry the liquid droplet so that the object to be measured is held onto the surface of the substrate; an analysis portion configured to irradiate the object to be measured with an X-ray and perform quantitative analysis of an element contained in the object to be measured based on a fluorescent X-ray output from the object to be measured; a beam sensor configured to emit a laser having a band shape for detecting an amount of the liquid droplet separated from the collecting portion before the liquid droplet is dried after the object to be measured is collected; and a calculating portion configured to calculate a correction coefficient for correcting the amount of the liquid droplet or a quantitative analysis value of the object to be measured based on a detection result of the beam sensor.