The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 20, 2021

Filed:

Mar. 27, 2019
Applicant:

Sandisk Technologies Llc, Addison, TX (US);

Inventors:

Takaaki Iwai, Yokkaichi, JP;

Yoshitaka Otsu, Yokkaichi, JP;

Hisakazu Otoi, Yokkaichi, JP;

Assignee:

SANDISK TECHNOLOGIES LLC, Addison, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/11 (2006.01); H01L 27/11582 (2017.01); H01L 27/11565 (2017.01); H01L 27/1157 (2017.01); H01L 27/11573 (2017.01); H01L 27/11558 (2017.01); H01L 27/11519 (2017.01); H01L 27/11529 (2017.01); H01L 27/11556 (2017.01); H01L 27/11524 (2017.01);
U.S. Cl.
CPC ...
H01L 27/11582 (2013.01); H01L 27/1157 (2013.01); H01L 27/11519 (2013.01); H01L 27/11524 (2013.01); H01L 27/11529 (2013.01); H01L 27/11556 (2013.01); H01L 27/11558 (2013.01); H01L 27/11565 (2013.01); H01L 27/11573 (2013.01);
Abstract

A three-dimensional memory device includes alternating stacks of insulating layers and electrically conductive layers located over a semiconductor material layer, and memory stack structures extending through one of the alternating stacks. Laterally-undulating backside trenches are present between alternating stacks, and include a laterally alternating sequence of straight trench segments and bulging trench segments. Cavity-containing dielectric fill structures and contact via structures are present in the laterally-undulating backside trenches. The contact via structures are located within the bulging trench segments. The contact via structures are self-aligned to sidewalls of the alternating stacks. Additional contact via structures may vertically extend through a dielectric alternating stack of a subset of the insulating layers and dielectric spacer layers laterally adjoining one of the alternating stacks.


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