The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 20, 2021

Filed:

Jan. 18, 2019
Applicant:

Sandisk Technologies Llc, Addison, TX (US);

Inventors:

Chun Ge, San Jose, CA (US);

Yanli Zhang, San Jose, CA (US);

Fei Zhou, San Jose, CA (US);

Raghuveer S. Makala, Campbell, CA (US);

Assignee:

SANDISK TECHNOLOGIES LLC, Addison, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/115 (2017.01); H01L 27/11568 (2017.01); H01L 27/1159 (2017.01); H01L 29/423 (2006.01); H01L 29/792 (2006.01); H01L 29/51 (2006.01); H01L 29/78 (2006.01); H01L 21/28 (2006.01);
U.S. Cl.
CPC ...
H01L 27/11568 (2013.01); H01L 27/1159 (2013.01); H01L 29/40111 (2019.08); H01L 29/42332 (2013.01); H01L 29/517 (2013.01); H01L 29/518 (2013.01); H01L 29/78391 (2014.09); H01L 29/792 (2013.01);
Abstract

A combination of an alternating stack and a memory opening fill structure is provided over a substrate. The alternating stack includes insulating layers and electrically conductive layers. The memory opening fill structure vertically extends through the alternating stack, and includes a memory film, a vertical semiconductor channel, and a core structure comprising a core material. A phase change material is employed for the core material. A volume expansion is induced in the core material by performing an anneal process that induces a microstructural change within the core material. The volume expansion in the core material induces a lateral compressive strain and a vertical tensile strain within the vertical semiconductor channel. The vertical tensile strain enhances charge mobility in the vertical semiconductor channel, and increases the on-current of the vertical semiconductor channel.


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