The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 20, 2021
Filed:
Jul. 22, 2016
Applicants:
Intel Corporation, Santa Clara, CA (US);
Jamel Tayeb, Beaverton, OR (US);
Robert F. Kwasnick, Palo Alto, CA (US);
Inventors:
Jamel Tayeb, Beaverton, OR (US);
Robert F. Kwasnick, Palo Alto, CA (US);
Assignee:
Intel Corporation, Santa Clara, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/34 (2006.01); G06F 11/30 (2006.01); H04Q 9/00 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3495 (2013.01); G06F 11/3058 (2013.01); G06F 11/3072 (2013.01); G06F 11/3089 (2013.01); G06F 11/3096 (2013.01); H04Q 9/00 (2013.01); G06F 2201/81 (2013.01);
Abstract
System and techniques for autonomously adaptive performance monitoring are described herein. A device state may be measured. A measurement set may be located using the device state. A difference set between the measurement set and a current measurement group may be identified. The current measurement group may be changed into a next measurement group using the difference set. A measurement package created during at least one sample period of the next measurement group may be sent to a remote device.