The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 13, 2021
Filed:
Aug. 14, 2019
Sandisk Technologies Llc, Addison, TX (US);
Biswajit Ray, Madison, AL (US);
Peter Rabkin, Cupertino, CA (US);
Mohan Dunga, Santa Clara, CA (US);
Gerrit Jan Hemink, San Ramon, CA (US);
Changyuan Chen, San Ramon, CA (US);
SanDisk Technologies LLC, Addison, TX (US);
Abstract
Apparatuses and techniques are provided for programming memory cells while reducing widening of a threshold voltage distribution due to changes in the temperature between the time of programming and the time of a subsequent read operation. One technique is based on a correlation between program speed and temperature coefficient (Tco). A different verify test is used for different memory cells which have a common assigned data state according to the program loop number and the temperature. Another technique is based on sensing the memory cells to measure their subthreshold slope and classifying the memory cells into groups. The sensing can occur as a separate operation before programming or as part of the programming of user data. The subsequent programming of the memory cells involves adjusting the verify test of each memory cell based on its group and the temperature.