The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 13, 2021
Filed:
Jan. 25, 2018
Rigaku Corporation, Tokyo, JP;
Yayoi Taniguchi, Tokyo, JP;
Keiichi Morikawa, Tokyo, JP;
RIGAKU CORPORATION, Tokyo, JP;
Abstract
An X-ray analysis assistance device with an input and operation devicefor arbitrarily inputting and setting the value of one from among the distance L between a sample S and a two-dimensional detectorand the maximum detection range Xmax for X-rays scattered or diffracted by the sample S, and a central processing unitfor automatically setting the other setting item on the basis of the value of the one setting item set by the input and operation device. Further, the maximum measurement frame Hmax for the X-rays is displayed on a display screenof a display deviceon the basis of the distance L and maximum detection range Xmax. Additionally, an X-ray detection area A indicating the range within which it is possible for the detection surface of the two-dimensional detectorto detect X-rays is displayed on the display screenof the display device