The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 06, 2021

Filed:

Jul. 08, 2019
Applicant:

Taiwan Semiconductor Manufacturing Co., Ltd., Hsinchu, TW;

Inventors:

Ming-Heng Tsai, Taipei, TW;

Chun-Sheng Liang, Changhua County, TW;

Kuo-Hua Pan, Hsinchu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/00 (2006.01); H01L 29/66 (2006.01); H01L 29/78 (2006.01); H01L 27/108 (2006.01); H01L 27/088 (2006.01); H01L 21/84 (2006.01); H01L 29/417 (2006.01);
U.S. Cl.
CPC ...
H01L 29/6681 (2013.01); H01L 29/66545 (2013.01); H01L 29/66795 (2013.01); H01L 29/7851 (2013.01); H01L 21/845 (2013.01); H01L 27/0886 (2013.01); H01L 27/10879 (2013.01); H01L 29/41791 (2013.01); H01L 29/785 (2013.01);
Abstract

A method for manufacturing a semiconductor device includes forming a shallow trench isolation (STI) structure surrounding a pair of semiconductor fins; forming a dummy gate layer over the STI structure and the semiconductor fins; etching a first portion of the dummy gate layer to form a trench through the dummy gate layer until the STI structure is exposed, in which the trench extends between the semiconductor fins along a lengthwise direction of the semiconductor fins; forming an insulating structure in the trench through the dummy gate layer; after forming the insulating structure extending through the dummy gate layer, patterning the dummy gate layer to form a pair of dummy gate structures each of which is across a respective one of the semiconductor fins; and replacing the dummy gate structures with a pair of metal gate structures.


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