The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 06, 2021

Filed:

Jun. 17, 2020
Applicant:

Hitachi High-tech Corporation, Tokyo, JP;

Inventors:

Takanori Kishimoto, Tokyo, JP;

Ichiro Tachibana, Tokyo, JP;

Naomasa Suzuki, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/22 (2006.01); H01J 37/244 (2006.01); H01J 37/10 (2006.01); H01J 37/21 (2006.01); H01J 37/28 (2006.01);
U.S. Cl.
CPC ...
H01J 37/22 (2013.01); H01J 37/10 (2013.01); H01J 37/21 (2013.01); H01J 37/244 (2013.01); H01J 37/28 (2013.01); H01J 2237/2448 (2013.01); H01J 2237/2449 (2013.01); H01J 2237/2806 (2013.01); H01J 2237/2809 (2013.01); H01J 2237/2817 (2013.01);
Abstract

This charged particle beam device is provided with: a plurality of detectors for detecting secondary particles, the detectors being disposed in a symmetrical manner around the optical axis of a primary charged particle beam closer to the charged particle source side than an objective lens; electrodes for forming an electric field oriented in directions corresponding to each of the plurality of detectors, the electrodes being provided on the travel routes of secondary particles from a sample to the detectors; and a control power supply for applying a voltage to the electrodes. Adjusting the voltage applied to each of the electrodes makes it possible to detect, upon deflecting, the secondary particles, and to control the range of azimuths of the secondary particles to be detected.


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