The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 06, 2021

Filed:

May. 22, 2019
Applicant:

Here Global B.v., Eindhoven, NL;

Inventors:

David Johnston Lawlor, Chicago, IL (US);

Anish Mittal, San Francisco, CA (US);

Zhanwei Chen, Richmond, CA (US);

Assignee:

HERE GLOBAL B.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/46 (2006.01); G06K 9/62 (2006.01); G06F 16/535 (2019.01); G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
G06K 9/623 (2013.01); G06F 16/535 (2019.01); G06K 9/0063 (2013.01); G06K 9/4604 (2013.01);
Abstract

An approach is provided for priority ranking of satellite images. The approach, for example, involves processing a plurality of images using a feature detector to determine a set of features on each image of the plurality of images. The approach also involves determining a count of feature correspondences between each pair of images of the plurality of images based on the set of features of said each image. The approach further involves computing a ranking of the plurality of images based on the count of features correspondences between said each pair of images. The approach further involves providing the ranking of the plurality of images as an output for selecting one or more images of the plurality of images for feature creation.


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