The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 30, 2021

Filed:

Nov. 15, 2018
Applicant:

Synopsys, Inc., Mountain View, CA (US);

Inventors:

Leonid Alexander Broukhis, Mountain View, CA (US);

Boris Gommershtadt, Mevaseret Zion, IL;

Florent Duru, Mountain View, CA (US);

Gabriel Gouvine, Mountain View, CA (US);

Dmitry Korchemny, Kfar Saba, IL;

Assignee:

SYNOPSYS, INC., Mountain View, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/3185 (2006.01); G06F 11/26 (2006.01); G06F 9/30 (2018.01); G06F 11/267 (2006.01); G06F 30/331 (2020.01); G01R 31/327 (2006.01);
U.S. Cl.
CPC ...
G01R 31/318536 (2013.01); G06F 9/30134 (2013.01); G06F 11/261 (2013.01); G06F 11/267 (2013.01); G06F 30/331 (2020.01);
Abstract

Coverage event counters for hardware verification emulations are implemented as linear feedback shift register-based counters generating encoded counter values indicative of a detected number of coverage events. To decode those counter values, a counter algorithm utilized to generate the encoded counter value may continue to be iterated after counting is complete until reaching a defined pattern, while counting the number of iterations (K) necessary to reach the defined pattern. The resulting counter value having the defined pattern is correlated with a mapping table to identify a numerical value, and an ordinal counter value indicative of the number of coverage events is determined based on the identified numerical value, less K.


Find Patent Forward Citations

Loading…