The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 23, 2021

Filed:

Jan. 14, 2020
Applicant:

Anritsu Corporation, Kanagawa, JP;

Inventor:

Tomohiko Maruo, Kanagawa, JP;

Assignee:

ANRITSU CORPORATION, Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/00 (2015.01); H04B 17/15 (2015.01); H04B 17/24 (2015.01); H04B 17/10 (2015.01); H04B 5/00 (2006.01);
U.S. Cl.
CPC ...
H04B 17/15 (2015.01); H04B 5/0031 (2013.01); H04B 17/102 (2015.01); H04B 17/24 (2015.01);
Abstract

An antenna apparatus is configured to include: a DUT scan mechanism that executes total spherical scanning on a DUT having an antenna in an internal space of an OTA chamber around a reference point; a plurality of antennas disposed at a distance within a near field measurement range from the reference point; and signal analysis devices that respectively perform a near field measurement process related to total radiated power (TRP) based on reception signals of the antennas which receive radio signals in a spurious frequency bandwidth radiated from the antenna transmitting and receiving radio signals in a specified frequency bandwidth, during execution of the total spherical scanning.


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