The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 23, 2021

Filed:

Oct. 30, 2018
Applicant:

Mediatek Inc., Hsin-Chu, TW;

Inventor:

Hsien-Hsin Lin, Hsinchu, TW;

Assignee:

MediaTek Inc., Hsin-Chu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/105 (2006.01); H01L 21/768 (2006.01); H01L 21/311 (2006.01); H01L 29/66 (2006.01); H01L 21/033 (2006.01);
U.S. Cl.
CPC ...
H01L 21/76897 (2013.01); H01L 21/0337 (2013.01); H01L 21/31116 (2013.01); H01L 29/6656 (2013.01); H01L 29/66545 (2013.01);
Abstract

A method for forming a self-aligned contact includes providing a substrate with a plurality of gate structures including spacers on opposite sides. The method also includes forming a sacrificial layer between the gate structures. The method also includes forming a mask layer on a part of the sacrificial layer. The method also includes forming a plurality of first openings by removing the sacrificial layer exposed from the mask layer. The method also includes forming a dielectric layer in the plurality of first openings. The method also includes removing the mask layer. The method also includes forming a plurality of second openings by removing the sacrificial layer that remains on the substrate. The method also includes forming a plurality of first contact plugs in the second openings.


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