The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 23, 2021
Filed:
Dec. 30, 2016
Automatic prediction of patient length of stay and detection of medical center readmission diagnoses
Applicant:
Intel Corporation, Santa Clara, CA (US);
Inventors:
Rita Chattopadhyay, Chandler, AZ (US);
Kalpana A. Algotar, Chandler, AZ (US);
Amith Harsha, Houston, TX (US);
Ravindra V. Narkhede, Chandler, AZ (US);
Assignee:
Intel Corporation, Santa Clara, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G16H 50/20 (2018.01); G16H 40/20 (2018.01); G16H 10/60 (2018.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G16H 50/20 (2018.01); G06N 20/00 (2019.01); G16H 10/60 (2018.01); G16H 40/20 (2018.01);
Abstract
Systems, apparatuses and methods may provide for technology that assigns confidence levels to data bins containing similarity data and length of stay data, wherein the similarity data and the length of stay data correspond to a plurality of previous admissions. Additionally, the confidence levels may be weighted based on a distribution metric that assigns higher weights to denser regions. A length of stay of a target admission may be predicted based on the weighted confidence levels.