The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 23, 2021
Filed:
Aug. 09, 2017
Applicant:
Intel Corporation, Santa Clara, CA (US);
Inventors:
Darshan Iyer, Sunnyvale, CA (US);
Nilesh K. Jain, Portland, OR (US);
Assignee:
Intel Corporation, Santa Clara, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01); G06K 9/00 (2006.01); A61B 5/0452 (2006.01); A61B 5/00 (2006.01); G06N 3/08 (2006.01); G06N 3/02 (2006.01);
U.S. Cl.
CPC ...
G06K 9/6267 (2013.01); A61B 5/00 (2013.01); A61B 5/0452 (2013.01); A61B 5/7267 (2013.01); A61B 5/7282 (2013.01); G06K 9/00536 (2013.01); G06K 9/6201 (2013.01); G06K 9/6261 (2013.01); G06K 9/6274 (2013.01); G06N 3/08 (2013.01); G06N 3/02 (2013.01);
Abstract
Methods, apparatus, systems and articles of manufacture to analyze time series data are disclosed. An example method includes sub sampling time series data collected by a sensor to generate one or more candidate samples of interest within the time series data. Feature vectors are generated for respective ones of the one or more candidate samples of interest. Classification of the feature vectors is attempted based on a model. In response to a classification of one of the feature vectors, the classification is stored in connection with the corresponding candidate sample.