The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 16, 2021
Filed:
Apr. 04, 2019
Applicant:
Marvell Asia Pte, Ltd., Singapore, SG;
Inventors:
Deepak I. Hanagandi, Bangalore, IN;
Igor Arsovski, Williston, VT (US);
Michael A. Ziegerhofer, Jeffersonville, VT (US);
Valerie H. Chickanosky, South Burlington, VT (US);
Kalpesh R. Lodha, Shahapur, IN;
Assignee:
Marvell Asia Pte., Ltd., Singapore, SG;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 29/42 (2006.01); G11C 29/12 (2006.01); G06F 11/08 (2006.01); G11C 8/08 (2006.01); G06F 11/10 (2006.01); H03M 13/19 (2006.01); G06F 3/06 (2006.01); G11C 29/52 (2006.01); G11C 29/44 (2006.01); G06F 11/16 (2006.01);
U.S. Cl.
CPC ...
G11C 29/42 (2013.01); G11C 29/1201 (2013.01); G06F 3/064 (2013.01); G06F 3/0619 (2013.01); G06F 11/08 (2013.01); G06F 11/1004 (2013.01); G06F 11/106 (2013.01); G06F 11/1008 (2013.01); G06F 11/1028 (2013.01); G06F 11/1072 (2013.01); G06F 11/1629 (2013.01); G06F 2211/109 (2013.01); G11C 8/08 (2013.01); G11C 29/44 (2013.01); G11C 29/4401 (2013.01); G11C 29/52 (2013.01); G11C 2029/1202 (2013.01); H03M 13/19 (2013.01);
Abstract
The present disclosure relates to a structure including a memory built-in self test (MBIST) circuit which is configured to repair a multi-cell failure for a plurality of patterns in a single wordline of a sliding window of a memory.