The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 16, 2021

Filed:

Aug. 21, 2019
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Harold B Noyes, Boise, ID (US);

David R. Brown, Lucas, TX (US);

Paul Glendenning, Woodside, CA (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01); G06F 11/10 (2006.01); H03M 13/09 (2006.01);
U.S. Cl.
CPC ...
G06F 11/1004 (2013.01); G06F 11/1076 (2013.01); H03M 13/09 (2013.01);
Abstract

Configuration content of electronic devices used for data analysis may be altered due to bit failure or corruption, for example. Accordingly, in one embodiment, a device includes a plurality of blocks, each block of the plurality of blocks includes a plurality of rows, each row of the plurality of rows includes a plurality of configurable elements, each configurable element of the plurality of configurable elements includes a data analysis element including a memory component programmed with configuration data. The data analysis element is configured to analyze at least a portion of a data stream based on the configuration data and to output a result of the analysis. The device also includes an error detection engine (EDE) configured to perform integrity validation of the configuration data.


Find Patent Forward Citations

Loading…