The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 16, 2021
Filed:
Mar. 29, 2019
Rigaku Corporation, Tokyo, JP;
Rigaku Corporation, Akishima, JP;
Abstract
A wavelength dispersive X-ray fluorescence spectrometer includes a single one-dimensional detector () having detection elements () arranged linearly, and includes a detector position change mechanism () for setting a position of the one-dimensional detector () to either a parallel position at which an arrangement direction of the detection elements () is parallel to a spectral angle direction of a spectroscopic device () or an intersection position at which the arrangement direction intersects the spectral angle direction. At the parallel position, a receiving surface of the one-dimensional detector () is located at a focal point of focused secondary X-rays (). At the intersection position, a receiving slit () is disposed at the focal point of the focused secondary X-rays (), and the receiving surface is located at a traveling direction side of the focused secondary X-rays () farther from the spectroscopic device () than the receiving slit ().