The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 09, 2021

Filed:

Jan. 16, 2020
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Marco Dallabora, Melegnano, IT;

Paolo Amato, Treviglio, IT;

Daniele Balluchi, Cernusco sul Naviglio, IT;

Danilo Caraccio, Buonalbergo, IT;

Emanuele Confalonieri, Lesmo, IT;

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 11/00 (2006.01); G11C 13/00 (2006.01); G06F 13/16 (2006.01);
U.S. Cl.
CPC ...
G11C 13/0069 (2013.01); G06F 13/1668 (2013.01); G11C 13/003 (2013.01); G11C 13/004 (2013.01); G11C 13/0004 (2013.01); G11C 13/0023 (2013.01); G11C 13/0035 (2013.01); G11C 13/0038 (2013.01); G11C 13/0097 (2013.01); G11C 2013/0088 (2013.01);
Abstract

The present disclosure includes apparatuses, and methods for data state synchronization. An example apparatus includes performing a write operation to store a data pattern in a group of resistance variable memory cells corresponding to a selected managed unit having a first status, updating a status of the selected managed unit from the first status to a second status responsive to performing the write operation, and providing data state synchronization for a subsequent write operation performed on the group by placing all of the variable resistance memory cells of the group in a same state prior to performing the subsequent write operation to store another data pattern in the group of resistance variable memory cells.


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