The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 02, 2021

Filed:

Apr. 30, 2019
Applicants:

At&t Intellectual Property I, L.p., Atlanta, GA (US);

At&t Mobility Ii Llc, Atlanta, GA (US);

Inventors:

He Yan, Berkeley Heights, NJ (US);

Zihui Ge, Madison, NJ (US);

Giritharan Rana, Basking Ridge, NJ (US);

Heather Magrini, Penfield, IL (US);

Jennifer Yates, Morristown, NJ (US);

Matthew Osinski, Westfield, NJ (US);

Brandon Hall, Atlanta, GA (US);

Edward Ball, Overland Park, KS (US);

Richard Miller, Dallas, GA (US);

Kathryn W. Childs, Concord, NC (US);

Assignees:

AT&T Intellectual Property I, L.P., Atlanta, GA (US);

AT&T Mobility II LLC, Atlanta, GA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 12/24 (2006.01);
U.S. Cl.
CPC ...
H04L 41/065 (2013.01); H04L 41/0613 (2013.01); H04L 41/0654 (2013.01); H04L 41/5009 (2013.01);
Abstract

A method includes collecting operational data from a system, segregating the data into a first component comprising one or more service quality anomalies and a second component comprising one or more network-based events, correlating the first component and the second component to determine whether the one or more network-based events have an impact on service quality, and prioritizing a resolution of the network-based events that have an impact on service quality.


Find Patent Forward Citations

Yan, He. (2021). Automatic integrated control loop for fault, performance and service quality management (U.S. Patent No. 10938624). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10938624

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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