The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 23, 2021

Filed:

Jan. 16, 2019
Applicant:

Applied Materials, Inc., Santa Clara, CA (US);

Inventors:

Ji-Dih Hu, San Jose, CA (US);

Ala Moradian, Sunnyvale, CA (US);

Assignee:

Applied Materials, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/67 (2006.01); G01K 11/12 (2021.01); G01J 5/34 (2006.01); H01L 21/687 (2006.01); H01L 21/66 (2006.01); H01L 21/324 (2006.01);
U.S. Cl.
CPC ...
H01L 21/67248 (2013.01); G01J 5/34 (2013.01); G01K 11/12 (2013.01); H01L 21/324 (2013.01); H01L 21/67115 (2013.01); H01L 21/68792 (2013.01); H01L 22/20 (2013.01); H01L 22/10 (2013.01);
Abstract

A method and apparatus to determine a temperature of a substrate using a spectrum of radiation is disclosed herein. In one aspect, a process chamber includes a lamp assembly optically coupled to a spectrometer. The spectrometer is used to determine a temperature of a substrate within the process chamber. A controller is coupled to the spectrometer and controls the lamp assembly to selectively heat and cool the substrate. In another aspect, a method of includes exposing a substrate to a radiation source. A spectrum of radiation is detected by a spectrometer across a substrate. The spectrum of radiation passed through the substrate is determined and used to determine a temperature of the substrate.


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