The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 23, 2021
Filed:
Apr. 17, 2019
Applicant:
Intel Ip Corporation, Santa Clara, CA (US);
Inventors:
Yuval Amizur, Kfar-Saba, IL;
Nir Dvorecki, Herzeliya, IL;
Assignee:
Intel IP Corporation, Santa Clara, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04W 4/02 (2018.01); G01S 3/14 (2006.01); H04W 64/00 (2009.01); G01S 3/04 (2006.01); G01S 5/04 (2006.01); H04W 4/33 (2018.01); G01S 3/48 (2006.01); G01S 5/08 (2006.01); H04B 7/06 (2006.01); H04L 5/00 (2006.01); H04L 29/08 (2006.01); H04L 29/06 (2006.01); H04W 16/28 (2009.01); G01S 3/74 (2006.01); H04B 7/0413 (2017.01); H04B 7/0452 (2017.01);
U.S. Cl.
CPC ...
G01S 3/14 (2013.01); G01S 3/043 (2013.01); G01S 3/48 (2013.01); G01S 5/04 (2013.01); G01S 5/08 (2013.01); H04B 7/06 (2013.01); H04L 5/0007 (2013.01); H04L 67/12 (2013.01); H04L 69/22 (2013.01); H04W 4/025 (2013.01); H04W 4/33 (2018.02); H04W 16/28 (2013.01); H04W 64/00 (2013.01); G01S 3/74 (2013.01); H04B 7/0413 (2013.01); H04B 7/0452 (2013.01); H04L 5/0023 (2013.01); H04W 64/003 (2013.01);
Abstract
Devices and methods of estimating the AoD of a STA are generally described. The STA receives comparison symbols from a first AP antenna. The comparison symbols are received prior to and after switching of transmitter chains from a first set of antennas to a second set of antennas. AoD symbols are received immediately after the comparison symbols. A phase and amplitude correction is determined based on a phase and amplitude change between the comparison symbols and the second AoD symbol corrected based thereon. The AoD is subsequently estimated based on the symbol measurements.