The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 16, 2021
Filed:
Jun. 29, 2018
Applicant:
Intel Corporation, Santa Clara, CA (US);
Inventors:
Vincent Von Bokern, Rescue, CA (US);
Siddhartha Chhabra, Portland, OR (US);
Assignee:
Intel Corporation, Santa Clara, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 21/64 (2013.01); G06F 12/14 (2006.01); G06F 21/60 (2013.01); G06F 21/78 (2013.01); H04L 9/32 (2006.01); G06F 9/455 (2018.01); H03M 13/09 (2006.01);
U.S. Cl.
CPC ...
G06F 21/64 (2013.01); G06F 9/45558 (2013.01); G06F 12/1408 (2013.01); G06F 21/602 (2013.01); G06F 21/78 (2013.01); H03M 13/09 (2013.01); H04L 9/3242 (2013.01); G06F 2009/45583 (2013.01); G06F 2212/1052 (2013.01); G06F 2212/402 (2013.01); H04L 2209/34 (2013.01);
Abstract
Technologies for verifying the integrity of regions of physical memory allocated among multiple domains are described. In embodiments the technologies include or cause: the generation of a first integrity value in response to a write command from a first domain; the generation of a second integrity value in response to a read command; and verifying the integrity of read data targeted by the read command at least in part by comparing the first integrity value to the second integrity value.