The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 16, 2021

Filed:

Sep. 04, 2018
Applicant:

Advantest Corporation, Tokyo, JP;

Inventors:

Shinji Sugatani, Saitama, JP;

Shigeki Nishina, Saitama, JP;

Jun Matsumoto, Saitama, JP;

Masahiro Takizawa, Saitama, JP;

Minoru Soma, Saitama, JP;

Akio Yamada, Saitama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B23K 26/34 (2014.01); B23K 15/00 (2006.01); B33Y 10/00 (2015.01); B33Y 30/00 (2015.01); B23K 15/02 (2006.01); B33Y 50/02 (2015.01); B22F 3/105 (2006.01); B29C 64/268 (2017.01); B29C 64/153 (2017.01); B33Y 40/00 (2020.01);
U.S. Cl.
CPC ...
B23K 15/0086 (2013.01); B22F 3/1055 (2013.01); B23K 15/0013 (2013.01); B23K 15/0026 (2013.01); B23K 15/02 (2013.01); B29C 64/153 (2017.08); B29C 64/268 (2017.08); B33Y 10/00 (2014.12); B33Y 30/00 (2014.12); B33Y 50/02 (2014.12); B22F 2003/1056 (2013.01); B22F 2003/1057 (2013.01); B22F 2999/00 (2013.01); B33Y 40/00 (2014.12);
Abstract

Provided is a three-dimensional laminating and shaping apparatusincluding a column unitthat is configured to output an electron beam EB and deflect the electron beam EB toward the front surface of a powder layer, an electron detectorthat is configured to detect electrons that may be emitted in a predetermined direction from the front surface of the powder layerwhen the powder layeris irradiated with the electron beam EB, a melting judging unitthat is configured to generate a melting signal based on the strength of the detection signal from the electron detector, and a deflection controllerthat is configured to receive the melting signal to determine the condition of the irradiation the electron beam.


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