The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 09, 2021

Filed:

Sep. 18, 2019
Applicant:

Realtek Semiconductor Corp., HsinChu, TW;

Inventors:

Kuo-Wei Chi, Hsinchu, TW;

Chun-Chi Yu, Hsinchu County, TW;

Chih-Wei Chang, Hsinchu County, TW;

Gerchih Chou, San Jose, CA (US);

Shih-Chang Chen, Miaoli County, TW;

Fu-Chin Tsai, Taipei, TW;

Shih-Han Lin, Hsinchu County, TW;

Min-Han Tsai, Taichung, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 7/22 (2006.01);
U.S. Cl.
CPC ...
G11C 7/222 (2013.01); G11C 2207/2254 (2013.01);
Abstract

A memory controller comprising: a delay circuit, configured to use a first delay value and a second delay value to respectively delay a sampling clock signal to generate a first and a second delayed sampling clock signal; a sampling circuit, configured to use a first edge of the first delayed sampling clock signal to sample a data signal to generate a first sampling value, and configured to use a second edge of the second delayed sampling clock signal to sample the data signal to generate a second sampling value; and a calibrating circuit, configured to generate a sampling delay value according to the first delay value based on the first sampling value and the second sampling value. The delay circuit uses the sampling delay value to generate an adjusted sampling clock signal and the sampling circuit sample the data signal by the adjusted sampling clock signal.


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