The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 09, 2021

Filed:

Jan. 16, 2019
Applicant:

Advantest Corporation, Tokyo, JP;

Inventor:

Yoshiyuki Hata, Miyagi, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 33/00 (2006.01); G01R 33/02 (2006.01);
U.S. Cl.
CPC ...
G01R 33/0029 (2013.01); G01R 33/0017 (2013.01); G01R 33/0041 (2013.01); G01R 33/0094 (2013.01); G01R 33/02 (2013.01);
Abstract

A measuring apparatus that measures a measurement target amount generated from a measurement target, includes an additional amount generating section, a sensor, and a deriving section. The additional amount generating section generates an additional amount to be added to the measurement target amount. The sensor measures a composite amount of the measurement target amount added with the additional amount. The deriving section derives the measurement target amount from an output of the sensor. The additional amount is a pulse. The pulse has an amplitude higher than the absolute value of the maximum of the measurement target amount. The maximum of the pulse is zero. The pulse has a frequency high enough to ignore the 1/f noise. The deriving section detects the output value of the sensor to derive the measurement target amount.


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