The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 09, 2021

Filed:

Jul. 20, 2017
Applicant:

Nidec-read Corporation, Kyoto, JP;

Inventors:

Hidekazu Yamazaki, Kyoto, JP;

Norihiro Ota, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 1/073 (2006.01); G01R 3/00 (2006.01); G01R 31/26 (2020.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
G01R 1/07371 (2013.01); G01R 1/073 (2013.01); G01R 3/00 (2013.01); G01R 31/26 (2013.01); G01R 31/2601 (2013.01); G01R 31/28 (2013.01);
Abstract

This inspection jig is provided with: an inspection-side support member having a counter plate () provided with a facing surface (F) disposed to face the substrate; and an electrode-side support member () having supporting plates (-) disposed to face an electrode plate () located on the side opposite to the facing surface (F) of the counter plate () A probe supporting hole (), into and by which the rear end portion of the probe (Pr) is inserted and supported, is provided in the supporting plates (-), and the probe supporting hole () is provided with a restricting surface which is formed along a supporting line (V) inclined at a certain angle (θ) with respect to a reference line (Z), and which restricts the rear end portion of the probe (Pr) from moving in the direction perpendicular to the inclined direction of the supporting line (V).


Find Patent Forward Citations

Loading…