The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 02, 2021

Filed:

Dec. 22, 2015
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventors:

Guang-He Lee, Taipei, TW;

Kalpana A. Algotar, Redlands, CA (US);

Shao-Wen Yang, San Jose, CA (US);

Addicam V. Sanjay, Gilbert, AZ (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 7/10 (2006.01); G01S 1/04 (2006.01); G01S 13/75 (2006.01); G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
G06K 7/10099 (2013.01); G01S 1/04 (2013.01); G01S 13/75 (2013.01); G06K 7/10029 (2013.01); G06K 9/6282 (2013.01);
Abstract

A set of samples are returned by radio frequency identifier (RFID) reader corresponding to the readings of signals emitted from a particular RFID tag, each sample including a respective set of features identifying values of the attributes of the signals as detected. At least some of the features are provided as inputs to a random forest of decision trees, each providing a prediction that the particular RFID tag is located in one of a plurality of defined zones in a particular environment. From outputs of the plurality of decision trees based on the set of samples, it can be determined that the particular RFID tag is located in a particular one of the plurality of zones at a first instance in time.


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