The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 02, 2021

Filed:

May. 17, 2016
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventors:

Mayue Xie, Phoenix, AZ (US);

Chengqing Hu, Chandler, AZ (US);

Jong-Ru Guo, Portland, OR (US);

Zuoguo Wu, San Jose, CA (US);

Deepak Goyal, Phoenix, AZ (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 31/11 (2006.01); H04B 10/071 (2013.01);
U.S. Cl.
CPC ...
G01R 31/2837 (2013.01); G01R 31/11 (2013.01); G01R 31/2841 (2013.01); H04B 10/071 (2013.01);
Abstract

Disclosed herein are systems and methods for the characterization of transmission media, among other embodiments. For example, a system for characterizing a transmission medium may include: a waveform generator to generate an initial input waveform; waveform pre-processing circuitry to process the initial waveform to generate a processed input waveform for provision to the transmission medium, wherein the processed input waveform has a maximum amplitude greater than a maximum amplitude of the initial input waveform; and waveform output circuitry to display or store data representative of an initial output waveform, wherein the initial output waveform is output from the transmission medium as a reflection or transmission of the processed input waveform.


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