The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 02, 2021
Filed:
Dec. 14, 2018
Aditi Chattopadhyay, Chandler, AZ (US);
Bonsung Koo, Tempe, AZ (US);
Lenore Dai, Phoenix, AZ (US);
Ryan Gunckel, Tempe, AZ (US);
Jack Miller, Rochester, MN (US);
Aditi Chattopadhyay, Chandler, AZ (US);
Bonsung Koo, Tempe, AZ (US);
Lenore Dai, Phoenix, AZ (US);
Ryan Gunckel, Tempe, AZ (US);
Jack Miller, Rochester, MN (US);
ARIZONA BOARD OF REGENTS ON BEHALF OF ARIZONA STATE UNIVERSITY, Scottsdale, AZ (US);
Abstract
Methods and systems are provided for detecting mechanophore damage in a composite material where the mechanophores are embedded in a matrix of the composite material. A mechanical load is applied to the composite material. A damage precursor signal is generated as a result of the mechanical load and is detected before yield of the mechanophore embedded composite material. Detecting the damage precursor signal may include illuminating the mechanophore embedded composite material with UV light to excite the embedded mechanophores, capturing fluorescent emissions of the embedded mechanophores with a UV camera, and filtering light received at the UV camera based on an emission wavelength of the mechanophores. Alternatively, the damage precursor signal may be detected using spectra from an evanescent wave distorted by the mechanophore embedded composite material using an attenuated total reflectance-Fourier transform infrared spectroscopy (ATR-FTIR) system.