The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 26, 2021
Filed:
Aug. 23, 2018
Fei Company, Hillsboro, OR (US);
Qiheng Yang, Gungahlin, AU;
Glenn Myers, Waramanga, AU;
Shane Latham, Griffith, AU;
Adrian Sheppard, Fisher, AU;
Andrew Kingston, Kambah, AU;
FEI Company, Hillsboro, OR (US);
Abstract
Methods and apparatuses disclosed herein provide beam hardening correction to tomographic reconstruction using a simplification to the Alvarez-Macovski attenuation model. An example method includes simplifying a forward projection model, the forward projection model based on an Alvarez-Macovski (AM) attenuation model, wherein the simplification of the forward projection model simplifies the AM attenuation model for one of photoelectric effect only, constant density, constant atomic number, and density proportional to atomic number, and performing an iterative reconstruction of a sample using the simplified forward projection model, the iterative reconstruction weighted by a first spectrum, wherein measured image data of the sample used in the iterative reconstruction is obtained at a first energy, and wherein a reverse operation of the iterative reconstruction is a non-adjoint to the simplified forward projection model.