The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 26, 2021
Filed:
Dec. 03, 2018
Applicant:
Mitutoyo Corporation, Kanagawa, JP;
Inventors:
Atsushi Shimaoka, Tokyo, JP;
Kazuhiko Hidaka, Tokyo, JP;
Assignee:
MITUTOYO CORPORATION, Kanagawa, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 5/28 (2006.01); G01B 5/20 (2006.01); G01B 7/34 (2006.01); G01B 5/00 (2006.01); G01B 5/30 (2006.01);
U.S. Cl.
CPC ...
G01B 5/201 (2013.01); G01B 5/0007 (2013.01); G01B 5/0009 (2013.01); G01B 5/20 (2013.01); G01B 5/28 (2013.01); G01B 7/34 (2013.01); G01B 5/30 (2013.01);
Abstract
A form measuring apparatus includes a base; an arm capable of swinging relative to the base; a coupler coupling the base and the arm, and having a deformation region that is capable of elastic deformation between the base and the arm; and a distortion detector installed in the deformation region. In the form measuring apparatus, a stylus is mounted to the arm and can slide along a surface of a work piece.