The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 26, 2021
Filed:
Feb. 24, 2012
Yuk Ming Dennis Lo, Homantin, HK;
Wai Kwun Rossa Chu, Shatin, HK;
Kwan Chee Chan, Mei Foo Sun Chuen, HK;
Tak Yeung Leung, Shatin, HK;
Peiyong Jiang, Shatin, HK;
Yuk Ming Dennis Lo, Homantin, HK;
Wai Kwun Rossa Chu, Shatin, HK;
Kwan Chee Chan, Mei Foo Sun Chuen, HK;
Tak Yeung Leung, Shatin, HK;
Peiyong Jiang, Shatin, HK;
The Chinese University of Hong Kong, New Territories, HK;
Abstract
Methods, systems, and apparatus are provided for determining zygosity of a multiple-fetus pregnancy using a biological sample taken from the mother. The fetal and maternal DNA in the sample (e.g. plasma) can be analyzed for a particular chromosomal region to identify genetic differences in the fetuses. For example, a normalized parameter for the measure of a primary or secondary allele can show variances for different chromosomal regions when fetuses are dizygotic. Such a variance can be determined relative to an expected value if the fetuses were genetically identical. Statistical methods are provided for analyzing the variation of the normalized parameters to determine fetal DNA concentration and the maternal-fetal mixed genotype at various loci. Parental genotype and haplotype information can also be used to identify inheritance of different parental haplotypes to indicate genetic differences among the fetuses.