The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 19, 2021

Filed:

Dec. 17, 2019
Applicant:

Pdf Solutions, Inc., Santa Clara, CA (US);

Inventor:

Brian E. Stine, Santa Clara, CA (US);

Assignee:

PDF Solutions, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01); H05K 1/02 (2006.01); G01R 31/317 (2006.01); H03K 19/00 (2006.01); H01L 21/66 (2006.01);
U.S. Cl.
CPC ...
H05K 1/0268 (2013.01); G01R 31/317 (2013.01); H01L 22/34 (2013.01); H03K 19/0016 (2013.01);
Abstract

A characterization vehicle may include a first test circuit and a second test circuit located on separate panels of a panelized printed circuit (PC) board. The first test circuit may be fabricated in accordance with a first plurality of design parameters. The second test circuit may be fabricated in accordance with a second plurality of design parameters. The first plurality of design parameters and the second plurality of design parameters may be chosen in accordance with a design of experiment (DOE) concerning one or more design rules or design trade-offs such that at least two corresponding design parameters from the first and second test circuits have identical values, and at least two corresponding design parameters from the first and second test circuits have different values.


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