The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 19, 2021

Filed:

Nov. 30, 2018
Applicant:

Northrop Grumman Systems Corporation, Falls Church, VA (US);

Inventors:

Michael E. Cooley, Severna Park, MD (US);

Bret J. Yon, Bowie, MD (US);

David Sall, Owings Mills, MD (US);

Robert J. March, Bel Air, MD (US);

Scott A. Wilson, Baltimore, MD (US);

John Hodge, Bowie, MD (US);

Alyssa Harris, Hanover, MD (US);

Nicholas Fasanella, Ventura, CA (US);

Assignee:

NORTHROP GRUMMAN SYSTEMS CORPORATION, Falls Church, VA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01Q 19/10 (2006.01); H01Q 1/28 (2006.01); H01Q 1/10 (2006.01); H01Q 19/18 (2006.01); H01Q 15/14 (2006.01); H01Q 3/06 (2006.01);
U.S. Cl.
CPC ...
H01Q 1/288 (2013.01); H01Q 1/10 (2013.01); H01Q 3/06 (2013.01); H01Q 15/145 (2013.01); H01Q 19/18 (2013.01);
Abstract

A planar reflectarray system provides for bandwidth broadening by employing a tunable (amplitude and phase) feed array. The tunable feed array is adjustable in amplitude and phase to compensate for aberrations by enabling feed re-focusing and field matching. The techniques modestly increase the size of the feed array and use active tuning to effectively correct for de-focusing when operating reflectarrays at frequencies away from the tuned center frequency.


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