The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 19, 2021
Filed:
Nov. 15, 2018
International Business Machines Corporation, Armonk, NY (US);
Sheng Nan Zhu, Shanghai, CN;
Guo Qiang Hu, Shanghai, CN;
Jun Zhu, Shanghai, CN;
Jing Chang Huang, Shanghai, CN;
Peng Ji, Nanjing, CN;
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Abstract
A computer implemented method for surface defect inspection that includes recording an optical image of a surface including a defect; converting the optical image including the defect into a heat map; extracting a region of interest including the defect from the heat map; and comparing the region of interest including the defect from the heat map to a binary classification model using a sliding window based voting mechanism to determine if the defect is greater than or less than a threshold failure value.