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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10896341 B1

PDFFull Text
Expired
Date of Patent:
Jan. 19, 2021

Filed:

Nov. 15, 2018

Efficient defect localization/segmentation for surface defect inspection

Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Sheng Nan Zhu, Shanghai, CN;

Guo Qiang Hu, Shanghai, CN;

Jun Zhu, Shanghai, CN;

Jing Chang Huang, Shanghai, CN;

Peng Ji, Nanjing, CN;

Assignee:

INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);

Attorneys:

Tutunjian & Bitetto, P.C.

Joseph Petrokaitis

Primary Examiner:

Idowu O Osifade

Int. Cl.
CPC ...
G06K 9/62 (2006.01); G06K 9/46 (2006.01); G06N 3/04 (2006.01); G06K 9/32 (2006.01); G06T 7/00 (2017.01); G06N 3/08 (2006.01);
U.S. Cl.
CPC ...
G06K 9/3233 (2013.01); G06K 9/4652 (2013.01); G06K 9/6256 (2013.01); G06K 9/6276 (2013.01); G06N 3/0418 (2013.01); G06N 3/08 (2013.01); G06T 7/001 (2013.01);
Abstract

A computer implemented method for surface defect inspection that includes recording an optical image of a surface including a defect; converting the optical image including the defect into a heat map; extracting a region of interest including the defect from the heat map; and comparing the region of interest including the defect from the heat map to a binary classification model using a sliding window based voting mechanism to determine if the defect is greater than or less than a threshold failure value.

Find Patent Forward Citations

Zhu, Sheng. (2021). Efficient defect localization/segmentation for surface defect inspection (U.S. Patent No. 10896341). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10896341

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