The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 19, 2021
Filed:
May. 10, 2018
Applicant:
Teradyne, Inc., North Reading, MA (US);
Inventors:
Michael C. Panis, Somerville, MA (US);
Jeffrey S. Benagh, Melrose, MA (US);
Richard Pye, Burlington, MA (US);
Assignee:
Teradyne, Inc., North Reading, MA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/22 (2006.01); G06F 13/42 (2006.01); G06F 11/273 (2006.01);
U.S. Cl.
CPC ...
G06F 11/221 (2013.01); G06F 11/273 (2013.01); G06F 13/42 (2013.01);
Abstract
An example test system includes instruments for controlling testing. Each instrument may be controlled by a processing unit. Each processing unit may be configured to operate on portions of a test program relevant to an instrument that the processing unit controls. A synchronization mechanism operates with at least some processing units to produce a synchronized sequence of actions, measurements, or measurements and actions at a test instrument interface absent intervention from a centralized controller.